Biography
Research Interests
Physical metallurgist and Transmission Electron Microscopist (TEM) with specialization in advanced characterization techniques and analysis, including
- 4D-STEM strain mapping and automated crystallographic orientation mapping (ACOM)
- in-situ TEM nanomechnical testing
- computational electron microscopy
- multislice electron microscopy simulations
- contributing to open source electron microscopy python packages (py4DSTEM)
- custom TEM-EDS quantification
- advanced image and data analysis
- custom computer vision (CV) algorithms for high-throughput analysis
- integration of ML into acquisition and analysis workflows along with conventional CV
Career Path
4 years at Intel Corp. as a Physical Failure R&D Analyst. Received an Innovator Award (2018) and awarded two invention disclosures on 3DXP technology.
3 years at LLNL as a staff scientist in the metallurgy and advanced microscopy group, LLNL
Subject Matter Expertise: Uranium and Titanium alloys, Transmission Electron Microscopy; advanced data analysis and code development utilizing computer vision in MATLAB/python.
Education
- Ph.D. Materials Science and Engineering, University of California at Berkeley, 2015
- M.S .Materials Science and Engineering, University of California at Berkeley, 2012
- B.S. Materials Science and Engineering, Stanford University, 2008
Publications
2018 1 publication
2014 1 publication
Other 4 publications
Awards
WPD Award, LLNL (2023)
- Outstanding Reviewer Award,Acta Materialia (2018)