Research Interests

Interests include atomic structures of amorphous materials; material dynamics during crystallization, solidification or other phase transformations and their applications on additive manufacturing; applications of coherent scanning electron diffraction; effect of electron or ion radiation on structural of materials; time-resolved defect formation and migration during high speed deformation.

Ph.D., Material Science and Engineering, University of Illinois at Urbana-Champaign, 2013

B.S., Combined Physics and Mathematics, University of British Columbia, 2006

1. T. Voisin M. D. Grapes, T. T. Li, M. K. Santala, Y. Zhang, J. P. Ligda, N. J. Lorenzo, B. E. Schuster, G. H. Campbell and T. P. Weihs, “In situ TEM Observations of High-Strain-Rate Deformation and Fracture in Pure Copper”, Materials Today 33, 10-16 (2020)
2. M. S Kesler, M. L. Neveau, W. G. Carter, H. B. Henderson, Z. C. Sims, D. Weiss, T. T Li, S. K. McCall, M. E. Glicksman, O. Rios, “Liquid Direct Reactive Interface Printing of Structural Aluminum Alloys”, Applied Materials Today 13, 339-343(2018)
3. N. H. Julian, T. T. Li, R. E. Rudd, J. Marian, “MS–STEM–FEM: A Parallelized Multi-Slice Fluctuation TEM Simulation Tool”, Ultramicroscopy 194, 117-125 (2018)
4. G. C. Egan, T. T. Li, J. D. Roehling, J. T. McKeown, G. H. Campbell, “In situ Dynamic TEM Characterization of Unsteady Crystallization During Laser Processing of Amorphous Germanium”, Acta Materialia 143, 13-19 (2018)
5. Z. C. Sims, O. Rios, D. Weiss, P. E. Turchi, A. Perron, J. R. Lee, T. T. Li, J. Hammons, M. Bagge-Hansen, T. M. Willey, K. An, Y. Chen, A. H. King and S. K. McCall, “High Performance Aluminum-Cerium Alloys for High-Temperature Applications”, Materials Horizons 4, 1070 (2017)
6. T.T. Li, L.B. Bayu Aji, T.W. Heo, M.K. Santala, S.O. Kucheyev and G.H. Campbell, “Effect of Medium Range Order on Pulsed Laser Crystallization of Amorphous Germanium Thin Films”, Applied Physics Letters 108, 221906 (2016).
7. Li T., Bogle, S.N. and Abelson J. R., "Quantitative Fluctuation Electron Microscopy in the STEM: Methods to Identify, Avoid, and Correct for Artifacts, Microscopy and Microanalysis", 20(5), 1605 (2014).
8. Li T. and Abelson J. R., "Quantifying nanoscale order in amorphous material via scattering covariance in fluctuation electron microscopy", Ultramicroscopy, 133, 95 (2013)
9. Li T., Lee T. H. Elliott S. R. and Abelson J. R., "Preferred Orientation of Nanoscale Order at the Surface of Ge2Sb2Te5 Thin film", Applied Physics Letters, 103, 201907 (2013)